bridge fault造句

• Through the simulative experiments about iddq detecting bridge faults in cmos and bicmos circuits , the fault coverage of iddq can be estimated
  并对cmos电路与bicmos电路的桥接故障作了iddq检测仿真实验,分析了iddq检测的故障覆盖率。
• One is hard fault , which means the stuck - open fault and the bridge fault ; another is soft fault , which refers to the component parameters going beyond the preassumed perfomance range . usually , these faults do not lead to a total failure of equipments
  一类称之为硬故障,指元件的开路和短路失效故障,另一类称之为软故障,指元件的参数超出预定的容差范围,一般它们均未使设备完全失效。
• Not only fault model , but also test arithmetic demand to be farther improved . the thesis , focusing on the 20 - port register file , makes a fault analysis , particularly in complex bridge fault and crosstalk coupling fault aroused by word - line and bit - line of 20 - port
  本文针对所设计的寄存器文件进行了故障分析,特别对20端口字线、位线引起的复杂桥接故障和串扰导致的耦合故障进行了详尽论述。
• The feasibility and effectiveness of the iddt testing are both validated by experiments . at last , transistor bridging faults are simulated based on iddq testing and gate bridging faults and stuck - at faults based on voltage testing through detaching a pattern pair into two independent patterns
  最后，把一个输入向量对看成两个独立的向量，分别采用稳态电流测试方法和电压测试方法模拟桥接故障的晶体管级故障和桥接故障的门级故障及固定故障。
• For the convenience of test , varied circuit chip defects caused by the production process are abstracted as all kinds of models . at present the commonly used fault models mainly consist of stuck - at fault , stuck - open fault , bridge fault , store fault , delay fault , etc . testing methods based on voltage testing mainly aim at stuck - at fault model and have also obtained satisfactory result in research for many years . bridge fault is tested easily by quiescent power supply current ( iddq ) testing method . in regard to stuck - open fault that is difficult to testd by quiescent power supply current ( iddq ) and voltage testing , it can is tested by the dynamic current ( iddt ) testing
  为了便于测试,我们将生产过程中集成电路出现的多种多样的缺陷抽象为各种模型。目前常用的故障模型主要有:固定故障,开路故障,桥接故障,存储故障,时滞故障等。电压测试主要针对固定型故障模型,多年的研究也取得了令人满意的结果; cmos电路中的桥接故障则宜用稳态电流测试方法( iddq )测试;对于电压和稳态电流难以测试的开路故障,可以使用瞬态电流测试( iddt )的方法进行测试。